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NSR database version of May 3, 2024.

Search: Author = I.Trimaille

Found 5 matches.

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1996BB22      Nucl.Instrum.Methods Phys.Res. B118, 499 (1996)

I.J.R.Baumvol, L.Borucki, J.Chaumont, J.-J.Ganem, O.Kaytasov, N.Piel, S.Rigo, W.H.Schulte, F.C.Stedile, I.Trimaille

Isotopic Tracing of Si During Thermal Growth of Si₃N₄ Ultrathin Films

NUCLEAR REACTIONS ²⁹Si(p, γ), E ≈ 324 keV; measured Eγ, Iγ; deduced σ.

doi: 10.1016/0168-583X(95)01478-0
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1994BA86      Nucl.Instrum.Methods Phys.Res. B85, 326 (1994)

G.Battistig, G.Amsel, I.Trimaille, J.-J.Ganem, S.Rigo, F.C.Stedile, I.J.R.Baumvol, W.H.Schulte, H.W.Becker

High Resolution Low Energy Resonance Depth Profiling of ¹⁸O in Near Surface Isotopic Tracing Studies

NUCLEAR REACTIONS ¹⁸O(p, α), E ≈ resonance; measured σ(E); deduced Si oxidation processes features. Depth profiling of ¹⁸O, near surface isotopic training.

doi: 10.1016/0168-583X(94)95837-8
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1994LO16      Nucl.Instrum.Methods Phys.Res. B85, 462 (1994)

J.G.Lopez, J.C.C.Wong, C.Ortega, J.Siejka, I.Trimaille, A.Sacuto, G.Linker, O.Meyer

Combination of IBA Techniques and Raman Spectroscopy to Study Defects in ¹⁸O Labelled YBaCuO Thin Films

NUCLEAR REACTIONS ¹⁸O(p, α), E=620-640 keV; measured σ(E). ^16,18O(α, α), E=3.045 MeV; measured Rutherford backscattering spectra, random, aligned geometries; deduced surface defects features in ¹⁸O labelled YBaCuO thin films. Combination of IBA, Raman spectroscopy techniques.

doi: 10.1016/0168-583X(94)95864-5
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1994ST13      Nucl.Instrum.Methods Phys.Res. B85, 248 (1994)

F.C.Stedile, I.J.R.Baumvol, J.-J.Ganem, S.Rigo, I.Trimaille, G.Battistig, W.H.Schulte, H.W.Becker

IBA Study of the Growth Mechanisms of Very Thin Silicon Oxide Films: The effect of wafer cleaning

NUCLEAR REACTIONS ^16,18O(α, α), E=1.8 MeV; measured Rutherford backscattering spectra; deduced very thin Si oxide films growth mechanisms features. Isotopic profiles from ion beam analysis methods.

doi: 10.1016/0168-583X(94)95821-1
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1992WO05      Nucl.Instrum.Methods Phys.Res. B64, 179 (1992)

J.C.C.Wong, C.Ortega, J.Siejka, I.Trimaille, A.Sacuto, M.Balkanski, G.Vizkelethy

Use of RBS and Raman Spectroscopy to Study Oxygen Mobility in YBaCuO Thin Films by ¹⁸O Tracing Experiments

NUCLEAR REACTIONS ¹⁸O(p, α), E ≈ 620-655 keV; measured σ(E); deduced oxygen mobility in YBaCuO thin films. Supplemented by Raman spectroscopy results, RBS, NRA techniques.

doi: 10.1016/0168-583X(92)95461-Y
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