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NSR database version of May 3, 2024.

Search: Author = J.G.Lopez

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1994LO16      Nucl.Instrum.Methods Phys.Res. B85, 462 (1994)

J.G.Lopez, J.C.C.Wong, C.Ortega, J.Siejka, I.Trimaille, A.Sacuto, G.Linker, O.Meyer

Combination of IBA Techniques and Raman Spectroscopy to Study Defects in ¹⁸O Labelled YBaCuO Thin Films

NUCLEAR REACTIONS ¹⁸O(p, α), E=620-640 keV; measured σ(E). ^16,18O(α, α), E=3.045 MeV; measured Rutherford backscattering spectra, random, aligned geometries; deduced surface defects features in ¹⁸O labelled YBaCuO thin films. Combination of IBA, Raman spectroscopy techniques.

doi: 10.1016/0168-583X(94)95864-5
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