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NSR database version of May 3, 2024.

Search: Author = C.Ortega

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2013BR11      Phys.Scr. T156, 014042 (2013)

R.Bredy, C.Ortega, M.Ji, J.Bernard, L.Chen, G.Montagne, S.Martin

Fragmentation of anthracene induced by collisions with 40 keV Ar⁸⁺ ions

NUCLEAR REACTIONS C, H(Ar, X), E=40 keV; measured reaction products; deduced relative yields after fragmentation of anthracene molecule, branching ratios. Comparison with experimental data.

doi: 10.1088/0031-8949/2013/T156/014042
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1997AM09      Nucl.Instrum.Methods Phys.Res. B122, 99 (1997)

G.Amsel, E.d'Artemare, G.Battistig, V.Morazzani, C.Ortega

A Characterisation of the Morphology of Porous Silicon Films by Proton Energy Loss Fluctuation Measurements with a Narrow Resonance in the ¹⁵N(p, αγ)¹²C Reaction

NUCLEAR REACTIONS ¹⁵N(p, α), E ≈ 429 keV; measured σ(E, θ); deduced porous silicon film morphology features.

doi: 10.1016/S0168-583X(96)00723-9
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1994LO16      Nucl.Instrum.Methods Phys.Res. B85, 462 (1994)

J.G.Lopez, J.C.C.Wong, C.Ortega, J.Siejka, I.Trimaille, A.Sacuto, G.Linker, O.Meyer

Combination of IBA Techniques and Raman Spectroscopy to Study Defects in ¹⁸O Labelled YBaCuO Thin Films

NUCLEAR REACTIONS ¹⁸O(p, α), E=620-640 keV; measured σ(E). ^16,18O(α, α), E=3.045 MeV; measured Rutherford backscattering spectra, random, aligned geometries; deduced surface defects features in ¹⁸O labelled YBaCuO thin films. Combination of IBA, Raman spectroscopy techniques.

doi: 10.1016/0168-583X(94)95864-5
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1994WO03      Nucl.Instrum.Methods Phys.Res. B85, 171 (1994)

J.C.C.Wong, J.Garcia Lopez, C.Ortega, J.Siejka, L.M.Mercandalli

Contribution of IBA Techniques to the Study of YBaCuO Thin Films with Anomalous c-Axis Lattice Parameter

doi: 10.1016/0168-583X(94)95808-4
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1992WO05      Nucl.Instrum.Methods Phys.Res. B64, 179 (1992)

J.C.C.Wong, C.Ortega, J.Siejka, I.Trimaille, A.Sacuto, M.Balkanski, G.Vizkelethy

Use of RBS and Raman Spectroscopy to Study Oxygen Mobility in YBaCuO Thin Films by ¹⁸O Tracing Experiments

NUCLEAR REACTIONS ¹⁸O(p, α), E ≈ 620-655 keV; measured σ(E); deduced oxygen mobility in YBaCuO thin films. Supplemented by Raman spectroscopy results, RBS, NRA techniques.

doi: 10.1016/0168-583X(92)95461-Y
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1990AB14      Nucl.Instrum.Methods Phys.Res. B 45, 100 (1990)

F.Abel, G.Amsel, E.D'artemare, C.Ortega, J.Siejka, G.Vizkelethy

Use of the ¹⁶O(³He, α)¹⁵O reaction for studying oxygen-containing thin films

NUCLEAR REACTIONS ¹⁶O(³He, α), E=1.5-2.5 MeV; measured products, ¹⁵O, ⁴He; deduced σ(θ). Data were imported from EXFOR entry D0326.

doi: 10.1016/0168-583X(90)90793-T
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Data from this article have been entered in the EXFOR database. For more information, access X4 datasetD0326.