NSR Query Results

Output year order : Descending
Format : Normal

NSR database version of May 10, 2024.

Search: Author = V.Morazzani

Found 1 matches.

Back to query form

1997AM09      Nucl.Instrum.Methods Phys.Res. B122, 99 (1997)

G.Amsel, E.d'Artemare, G.Battistig, V.Morazzani, C.Ortega

A Characterisation of the Morphology of Porous Silicon Films by Proton Energy Loss Fluctuation Measurements with a Narrow Resonance in the ¹⁵N(p, αγ)¹²C Reaction

NUCLEAR REACTIONS ¹⁵N(p, α), E ≈ 429 keV; measured σ(E, θ); deduced porous silicon film morphology features.

doi: 10.1016/S0168-583X(96)00723-9
Citations: PlumX Metrics