NSR Query Results
Output year order : Descending NSR database version of May 3, 2024. Search: Author = S.Rigo Found 3 matches. 1996BB22 Nucl.Instrum.Methods Phys.Res. B118, 499 (1996) I.J.R.Baumvol, L.Borucki, J.Chaumont, J.-J.Ganem, O.Kaytasov, N.Piel, S.Rigo, W.H.Schulte, F.C.Stedile, I.Trimaille Isotopic Tracing of Si During Thermal Growth of Si3N4 Ultrathin Films NUCLEAR REACTIONS 29Si(p, γ), E ≈ 324 keV; measured Eγ, Iγ; deduced σ.
doi: 10.1016/0168-583X(95)01478-0
1994BA86 Nucl.Instrum.Methods Phys.Res. B85, 326 (1994) G.Battistig, G.Amsel, I.Trimaille, J.-J.Ganem, S.Rigo, F.C.Stedile, I.J.R.Baumvol, W.H.Schulte, H.W.Becker High Resolution Low Energy Resonance Depth Profiling of 18O in Near Surface Isotopic Tracing Studies NUCLEAR REACTIONS 18O(p, α), E ≈ resonance; measured σ(E); deduced Si oxidation processes features. Depth profiling of 18O, near surface isotopic training.
doi: 10.1016/0168-583X(94)95837-8
1994ST13 Nucl.Instrum.Methods Phys.Res. B85, 248 (1994) F.C.Stedile, I.J.R.Baumvol, J.-J.Ganem, S.Rigo, I.Trimaille, G.Battistig, W.H.Schulte, H.W.Becker IBA Study of the Growth Mechanisms of Very Thin Silicon Oxide Films: The effect of wafer cleaning NUCLEAR REACTIONS 16,18O(α, α), E=1.8 MeV; measured Rutherford backscattering spectra; deduced very thin Si oxide films growth mechanisms features. Isotopic profiles from ion beam analysis methods.
doi: 10.1016/0168-583X(94)95821-1
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