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NSR database version of May 8, 2024.

Search: Author = W.Vandervorst

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2017HA18      Nucl.Instrum.Methods Phys.Res. B406, 115 (2017)

I.Harayama, D.Sekiba, Q.Zhao, A.Vantomme, W.Vandervorst, J.Meersschaut

Calibration of PIXE yields using Cu as a reference

COMPILATION Z=22-79; analyzed available data; deduced relative correction factor, h, for calibration of the X-ray yields in particle induced X-ray emission (PIXE).

doi: 10.1016/j.nimb.2017.02.053
Citations: PlumX Metrics

1994DE45      Nucl.Instrum.Methods Phys.Res. B85, 911 (1994)

W.De Coster, B.Brijs, P.Osiceanu, J.Alay, M.Caymax, W.Vandervorst

Ion Beam Mixing and Oxidation of a Si/Ge-Multilayer Under Oxygen Bombardment

NUCLEAR REACTIONS Si(α, α), E=1 MeV; measured Rutherford back scattering α-spectra before, after oxygen bombardment, different Ge-content fractions removal; deduced features of processes during ion, substrate interaction.

doi: 10.1016/0168-583X(94)95949-8
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1993DE43      Nucl.Instrum.Methods Phys.Res. B79, 483 (1993)

W.De Coster, B.Brijs, R.Moons, W.Vandervorst

Methodology for Resonance Depth Profiling with Target Tilting Applied to the 3.045 MeV ¹⁶O(α, α)¹⁶O Resonance

NUCLEAR REACTIONS, ICPND ¹⁶O(α, α), E ≈ 3.02-3.10 MeV; measured yield. Resonance depth profiling methodology.

doi: 10.1016/0168-583X(93)95394-K
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Data from this article have been entered in the EXFOR database. For more information, access X4 datasetF0692.

1992DE10      Nucl.Instrum.Methods Phys.Res. B64, 417 (1992)

W.De Coster, B.Brijs, J.Goemans, W.Vandervorst

Resonance Depth Profiling of Low-Z Elements with Target Biasing Applied to the 3.045 MeV ¹⁶O(α, α)¹⁶O Resonance

NUCLEAR REACTIONS ¹⁶O(α, α), E ≈ 3.01-3.09 MeV; measured yield vs E. Target biasing technique, resonance depth profiling.

doi: 10.1016/0168-583X(92)95507-N
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1992DE14      Nucl.Instrum.Methods Phys.Res. B66, 283 (1992)

W.De Coster, B.Brijs, J.Goemans, W.Vandervorst

Depth Profiling of Light-Z Elements with Elastic Resonances: Oxygen profiling with the 3.045 MeV ¹⁶O(α, α)¹⁶O resonance

NUCLEAR REACTIONS ¹⁶O(α, α), E=3.045 MeV; measured yield vs energy. Oxygen profiling.

doi: 10.1016/0168-583X(92)96165-U
Citations: PlumX Metrics