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NSR database version of May 19, 2024.

Search: Author = J.Goemans

Found 2 matches.

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1992DE10      Nucl.Instrum.Methods Phys.Res. B64, 417 (1992)

W.De Coster, B.Brijs, J.Goemans, W.Vandervorst

Resonance Depth Profiling of Low-Z Elements with Target Biasing Applied to the 3.045 MeV ¹⁶O(α, α)¹⁶O Resonance

NUCLEAR REACTIONS ¹⁶O(α, α), E ≈ 3.01-3.09 MeV; measured yield vs E. Target biasing technique, resonance depth profiling.

doi: 10.1016/0168-583X(92)95507-N
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1992DE14      Nucl.Instrum.Methods Phys.Res. B66, 283 (1992)

W.De Coster, B.Brijs, J.Goemans, W.Vandervorst

Depth Profiling of Light-Z Elements with Elastic Resonances: Oxygen profiling with the 3.045 MeV ¹⁶O(α, α)¹⁶O resonance

NUCLEAR REACTIONS ¹⁶O(α, α), E=3.045 MeV; measured yield vs energy. Oxygen profiling.

doi: 10.1016/0168-583X(92)96165-U
Citations: PlumX Metrics