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NSR database version of May 6, 2024.

Search: Author = R.Tonini

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1994AL38      Nucl.Instrum.Methods Phys.Res. A337, 394 (1994)

M.Alietti, F.Nava, R.Tonini, P.Cantoni, L.Stagni, A.Cavallini

Rapid Thermal Process-Induced Defects in Silicon Position Detectors

RADIOACTIVITY ²⁴¹Am, ²³⁹Pu, ²⁴⁴Cm(α); measured α-spectra; deduced rapid thermal process-induced defects characteristics in detectors. Diode, microstrip detectors.

doi: 10.1016/0168-9002(94)91108-8
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