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NSR database version of April 25, 2024.

Search: Author = F.Nava

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1994AL38      Nucl.Instrum.Methods Phys.Res. A337, 394 (1994)

M.Alietti, F.Nava, R.Tonini, P.Cantoni, L.Stagni, A.Cavallini

Rapid Thermal Process-Induced Defects in Silicon Position Detectors

RADIOACTIVITY ²⁴¹Am, ²³⁹Pu, ²⁴⁴Cm(α); measured α-spectra; deduced rapid thermal process-induced defects characteristics in detectors. Diode, microstrip detectors.

doi: 10.1016/0168-9002(94)91108-8
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1992BE67      Nucl.Instrum.Methods Phys.Res. A321, 172 (1992)

S.P.Beaumont, R.Bertin, C.N.Booth, C.Buttar, L.Carraresi, F.Cindolo, M.Colocci, F.H.Combley, S.D'Auria, C.del Papa, M.Dogru, M.Edwards, F.Ffori, F.Foster, A.Francescato, R.Gray, G.Hill, Y.Hou, P.Houston, G.Hughes, B.K.Jones, J.G.Lynch, B.Lisowski, J.Matheson, F.Nava, M.Nuti, V.O'Shea, P.G.Pelfer, C.Raine, J.Santana, I.J.Saunders, P.H.Seller, K.Shankar, P.H.Sharp, I.O.Skillicorn, T.Sloan, K.M.Smith, N.Tartoni, I.ten Have, R.M.Turnbull, U.Vanni, A.Vinattieri, A.Zichichi

Gallium Arsenide Microstrip Detectors for Charged Particles

RADIOACTIVITY ²⁴¹Am(α); measured α-particle response vs neutron fluence. ⁹⁰Sr(β^-); ¹⁰⁰Ru(β^-); measured β-spectra before, after fast neutron irradiation. Gallium arsenide microstrip detectors.

doi: 10.1016/0168-9002(92)90385-H
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