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NSR database version of May 3, 2024.

Search: Author = R.Michelmann

Found 5 matches.

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1996MI28      Nucl.Instrum.Methods Phys.Res. B108, 62 (1996)

R.W.Michelmann, H.Baumann, A.Markwitz, J.D.Meyer, K.Bethge

Investigation of Ultra Thin SiN(x)O(y) Layers Produced by Low-Energy Ion Implantation with NRA and Channeling-RBS

NUCLEAR REACTIONS ¹⁸O(p, α), E=152 keV; measured α spectra; ¹⁵N(p, αγ), E=429 keV; measured γ spectra; deduced implanted ions depth profile in Si.

doi: 10.1016/0168-583X(95)01047-5
Citations: PlumX Metrics

1996PR17      Nucl.Instrum.Methods Phys.Res. B117, 18 (1996)

U.Prigge, J.D.Meyer, R.W.Michelmann, K.Bethge

Investigation of the Reaction ¹⁵N(α, n)¹⁸F for Materials Analysis

NUCLEAR REACTIONS ¹⁵N(α, n), E=8-14 MeV; measured σ. Materials analysis application discussed.

doi: 10.1016/0168-583X(96)00233-9
Citations: PlumX Metrics

1996VO23      Nucl.Instrum.Methods Phys.Res. B117, 21 (1996)

M.Vollmer, J.D.Meyer, R.W.Michelmann, K.Bethge

Boron Detection using the Nuclear Reaction ¹¹B(p, α)2α

NUCLEAR REACTIONS ¹¹B(p, α), E=150-800 keV; measured σ(θ). Boron impurity detection application.

doi: 10.1016/0168-583X(96)00235-2
Citations: PlumX Metrics

1990KO21      Nucl.Instrum.Methods Phys.Res. B50, 19 (1990)

F.Kohl, J.Krauskopf, P.Misaelides, R.Michelmann, G.Wolf, K.Bethge

Determination of Nitrogen in Semiconductor Materials Using the ¹⁴N(p, α)¹¹C and ¹⁴N(d, n)¹⁵O Nuclear Reactions

NUCLEAR REACTIONS, ICPND ¹⁴N(p, α), (d, n), E=2-7 MeV; measured σ(E); deduced infrared absorption related parameter in semiconductors.

doi: 10.1016/0168-583X(90)90321-K
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetD0117.

1990MI11      Nucl.Instrum.Methods Phys.Res. B51, 1 (1990)

R.W.Michelmann, J.Krauskopf, J.D.Meyer, K.Bethge

Excitation Functions for the Reactions ¹⁰B(d, n)¹¹C and ¹²C(d, n)¹³N for Charged Particle Activation Analysis

NUCLEAR REACTIONS, ICPND ¹⁰B, ¹²C(d, n), E=0.5-6 MeV; measured absolute σ(E). Particle activation analysis.

doi: 10.1016/0168-583X(90)90530-8
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetF0507.

Note: The following list of authors and aliases matches the search parameter R.Michelmann: , R.W.MICHELMANN