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NSR database version of May 3, 2024.

Search: Author = J.A.Bardwell

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1994LE19      Nucl.Instrum.Methods Phys.Res. B85, 42 (1994)

W.N.Lennard, G.R.Massoumi, I.V.Mitchell, H.T.Tang, D.F.Mitchell, J.A.Bardwell

Measurements of Thin Oxide Films of SiO₂/Si(100)

NUCLEAR REACTIONS ¹⁶O(d, p), E=825 keV; measured particle spectra, yield; deduced ¹⁶O areal density of ultra-thin SiO₂ films.

doi: 10.1016/0168-583X(94)95782-7
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