NSR Query Results

Output year order : Descending
Format : Normal

NSR database version of May 2, 2024.

Search: Author = I.Vickridge

Found 7 matches.

Back to query form


2011GU27      J.Korean Phys.Soc. 59, 2010s (2011)

A.F.Gurbich, D.Abriola, N.P.Barradas, A.R.Ramos, I.Bogdanovic Radovic, M.Chiari, C.Jeynes, M.Kokkoris, M.Mayer, L.Shi, I.Vickridge

Measurements and Evaluation of Differential Cross-sections for In Beam Analysis

COMPILATION 16O(p, p0), E=0.5-4.9 MeV; calculated, analyzed σ(E, θ); deduced effect of single-particle resonance. Analyzed about 30 reactions, results presented only for one of them.

doi: 10.3938/jkps.59.2010
Citations: PlumX Metrics

1996VI12      Nucl.Instrum.Methods Phys.Res. B108, 367 (1996)

I.C.Vickridge, W.J.Trompetter, G.E.Coote

15N(d, α0)13C Cross Section and Angular Distribution Measurements for Ion Beam Analysis

NUCLEAR REACTIONS 15N(d, α), E=0.4-2 MeV; measured σ(E, θ). Comparisons with earlier results.

doi: 10.1016/0168-583X(95)01165-X
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetO0823.

1996VI13      Nucl.Instrum.Methods Phys.Res. B108, 403 (1996)

I.C.Vickridge, G.Amsel

Electronic Energy Loss at Zero Atomic Impact Parameter: Its importance for the Lewis effect and narrow nuclear resonance depth profiling

NUCLEAR REACTIONS 21Ne, 27Al, 29,30Si(p, γ), E ≈ resonance; calculated yields; deduced electronic energy loss effects. Depth profiling implications.

doi: 10.1016/0168-583X(95)01163-3
Citations: PlumX Metrics

1994VI05      Nucl.Instrum.Methods Phys.Res. B85, 95 (1994)

I.Vickridge, J.Tallon, M.Presland

High Precision Determination of 16O in High T(c) Superconductors by DIGME

NUCLEAR REACTIONS, ICPND 16O(d, pγ), E=0.5-2 MeV; measured yield vs E; deduced high T(c) superconductors 16O content.

doi: 10.1016/0168-583X(94)95792-4
Citations: PlumX Metrics

1992BA23      Nucl.Instrum.Methods Phys.Res. B66, 1 (1992)

G.Battistig, G.Amsel, E.d'Artemare, I.Vickridge

A Very Narrow Resonance in 18O(p, α)15N Near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O

NUCLEAR REACTIONS 18O(p, α), E ≈ 152-164 keV; measured relative yield vs E. 18O(p, γ), E ≈ resonance; measured γ-spectra. Depth profiling studies, Ta2O5, SiO2 layers, sharp 18O-16O interfaces.

doi: 10.1016/0168-583X(92)96133-J
Citations: PlumX Metrics

1991BA54      Nucl.Instrum.Methods Phys.Res. B61, 369 (1991)

G.Battistig, G.Amsel, E.d'Artemare, I.Vickridge

A Very Narrow Resonance in 18O(p, α)15N Near 150 keV: Application to isotopic tracing. I. Resonance width measurement

NUCLEAR REACTIONS 18O(p, α), E ≈ 150 keV; measured α-spectra; deduced isotopic tracing relevance. 19F deduced resonance Γ.

doi: 10.1016/0168-583X(91)95308-Z
Citations: PlumX Metrics

1990VI10      Europhys.Lett. 13, 635 (1990)

I.Vickridge, A.L'Hoir, J.Gyulai, C.Cohen, F.Abel

27Al(p, γ)28Si Narrow Resonance in Channelling: A measurement of inelastic energy transfers at small impact parameters

NUCLEAR REACTIONS, ICPND 27Al(p, γ), E ≈ 990-995 keV; measured σ(E). Axial channelling geometry, Al single crystal, UHV conditions.

doi: 10.1209/0295-5075/13/7/011
Citations: PlumX Metrics

Back to query form

Note: The following list of authors and aliases matches the search parameter I.Vickridge: , I.C.VICKRIDGE