NSR Query Results
Output year order : Descending NSR database version of May 10, 2024. Search: Author = G.Battistig Found 6 matches. 1997AM09 Nucl.Instrum.Methods Phys.Res. B122, 99 (1997) G.Amsel, E.d'Artemare, G.Battistig, V.Morazzani, C.Ortega A Characterisation of the Morphology of Porous Silicon Films by Proton Energy Loss Fluctuation Measurements with a Narrow Resonance in the 15N(p, αγ)12C Reaction NUCLEAR REACTIONS 15N(p, α), E ≈ 429 keV; measured σ(E, θ); deduced porous silicon film morphology features.
doi: 10.1016/S0168-583X(96)00723-9
1994BA86 Nucl.Instrum.Methods Phys.Res. B85, 326 (1994) G.Battistig, G.Amsel, I.Trimaille, J.-J.Ganem, S.Rigo, F.C.Stedile, I.J.R.Baumvol, W.H.Schulte, H.W.Becker High Resolution Low Energy Resonance Depth Profiling of 18O in Near Surface Isotopic Tracing Studies NUCLEAR REACTIONS 18O(p, α), E ≈ resonance; measured σ(E); deduced Si oxidation processes features. Depth profiling of 18O, near surface isotopic training.
doi: 10.1016/0168-583X(94)95837-8
1994BA87 Nucl.Instrum.Methods Phys.Res. B85, 572 (1994) G.Battistig, G.Amsel, E.d'Artemare, A.L'Hoir Multiple Scattering Induced Resolution Limits in Grazing Incidence Resonance Depth Profiling NUCLEAR REACTIONS 18O(p, α), E=150-210 keV; measured σ(E); deduced resonance depth profiling resolution features, geometry dependence.
doi: 10.1016/0168-583X(94)95885-8
1994ST13 Nucl.Instrum.Methods Phys.Res. B85, 248 (1994) F.C.Stedile, I.J.R.Baumvol, J.-J.Ganem, S.Rigo, I.Trimaille, G.Battistig, W.H.Schulte, H.W.Becker IBA Study of the Growth Mechanisms of Very Thin Silicon Oxide Films: The effect of wafer cleaning NUCLEAR REACTIONS 16,18O(α, α), E=1.8 MeV; measured Rutherford backscattering spectra; deduced very thin Si oxide films growth mechanisms features. Isotopic profiles from ion beam analysis methods.
doi: 10.1016/0168-583X(94)95821-1
1992BA23 Nucl.Instrum.Methods Phys.Res. B66, 1 (1992) G.Battistig, G.Amsel, E.d'Artemare, I.Vickridge A Very Narrow Resonance in 18O(p, α)15N Near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O NUCLEAR REACTIONS 18O(p, α), E ≈ 152-164 keV; measured relative yield vs E. 18O(p, γ), E ≈ resonance; measured γ-spectra. Depth profiling studies, Ta2O5, SiO2 layers, sharp 18O-16O interfaces.
doi: 10.1016/0168-583X(92)96133-J
1991BA54 Nucl.Instrum.Methods Phys.Res. B61, 369 (1991) G.Battistig, G.Amsel, E.d'Artemare, I.Vickridge A Very Narrow Resonance in 18O(p, α)15N Near 150 keV: Application to isotopic tracing. I. Resonance width measurement NUCLEAR REACTIONS 18O(p, α), E ≈ 150 keV; measured α-spectra; deduced isotopic tracing relevance. 19F deduced resonance Γ.
doi: 10.1016/0168-583X(91)95308-Z
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