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NSR database version of April 26, 2024.

Search: Author = V.Neu

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2017WI01      Phys.Rev. C 95, 034618 (2017)

H.Wilsenach, K.Zuber, D.Degering, R.Heller, V.Neu

High precision half-life measurement of ¹⁴⁷Sm α decay from thin-film sources

RADIOACTIVITY ¹⁴⁷Sm(α); measured Eα, Iα, isotopic abundance of ¹⁴⁷Sm, half-life of ¹⁴⁷Sm decay using natural Sm samples and ultra-low-background twin Frisch-grid ionization chamber (TF-GIC). GEANT4 simulation to determine the geometrical efficiency for each sample. Comparison with previous half-life measurements.

ATOMIC MASSES ^{144,147,148,149,150,152,154}Sm; measured isotopic abundances of natural Sm samples using inductively coupled plasma mass spectrometry (ICP-MS). Comparison with literature data.

doi: 10.1103/PhysRevC.95.034618
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