NSR Query Results
Output year order : Descending NSR database version of May 6, 2024. Search: Author = V.M.Prozesky Found 1 matches. 1994CA24 Nucl.Instrum.Methods Phys.Res. B85, 108 (1994) J.L.Campbell, W.J.Teesdale, J.A.Maxwell, V.M.Prozesky Thickness Measurement of Titanium Nitride Layers on Steel using PIXE and Proton Backscattering NUCLEAR REACTIONS Ti, N(p, p), E=2.4 MeV; measured proton enhanced, Rutherford backscattering spectra; deduced TiN layers thickness. Proton induced X-ray emission data used.
doi: 10.1016/0168-583X(94)95795-9
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