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NSR database version of May 19, 2024.

Search: Author = T.Xie

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1993LI62      Nucl.Instrum.Methods Phys.Res. B 79, 468 (1993)

J.Liu, T.Xie, H.J.Fischbeck

Nuclear resonance effects in the analysis of proton backscattering from carbon and silicon films

NUCLEAR REACTIONS ¹²C, Si(p, p), E=450 keV-2.2 MeV; measured products, ¹²C, Si; deduced σ(θ). Data were imported from EXFOR entry C1358.

doi: 10.1016/0168-583X(93)95390-Q
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Data from this article have been entered in the EXFOR database. For more information, access X4 datasetC1358.

1991LI42      Nucl.Instrum.Methods Phys.Res. B56/57, 744 (1991)

J.Liu, T.Xie, H.J.Fischbeck

Resonance Effects in Thin Film Proton Backscattering Spectrometry

NUCLEAR REACTIONS C(p, p), E=0.455-1.2 MeV; measured backscattering σ(θ) vs E; deduced thin film analysis implications.

doi: 10.1016/0168-583X(91)95017-8
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