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NSR database version of May 10, 2024.

Search: Author = T.Kupila-Rantala

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1994KU40      Nucl.Instrum.Methods Phys.Res. B84, 368 (1994)

T.Kupila-Rantala, J.Raisanen

External Beam Depth Profiling

NUCLEAR REACTIONS, ICPND ²³Na(p, γ), E=660-700 keV; ²³Na(p, γ), E ≈ 860-960 keV; measured thick target γ yield. External depth profiling applications.

doi: 10.1016/0168-583X(94)95729-0
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