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NSR database version of May 10, 2024.

Search: Author = S.M.Duvanov

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1994DU10      Nucl.Instrum.Methods Phys.Res. B85, 264 (1994)

S.M.Duvanov, A.P.Kobzev, A.M.Tolopa, D.M.Shirokov

Investigation of the Elements Depth Profiles in Surface Layers of Glass Modified by Ion Beam Assisted Deposition

NUCLEAR REACTIONS Ti, Cu, Ca, Si, Na, O(α, α), E=2.4 MeV; Cu, Ti, Ca, Si, Na, O, N, C(p, p), E=1.732 MeV; measured backscattered spectra; deduced elements depth profiles in surface layers.

doi: 10.1016/0168-583X(94)95824-6
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