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NSR database version of April 27, 2024.

Search: Author = S.C.Liew

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1994LI45      Nucl.Instrum.Methods Phys.Res. B85, 621 (1994)

S.C.Liew, K.K.Loh, S.M.Tang

Application of an Iterative Maximum-Likelihood Algorithm in PIXE Depth Profiling of Trace Elements

NUCLEAR REACTIONS ³¹P(p, X), E=0.6-2 MeV; calculated K X-ray yields; deduced application to trace elements depth profiling. Iterative maximum likelihood algorithm method.

ATOMIC PHYSICS ³¹P(p, X), E=0.6-2 MeV; calculated K X-ray yields; deduced application to trace elements depth profiling. Interative maximum likelihood algorithm method.

doi: 10.1016/0168-583X(94)95894-7
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1994OS06      Nucl.Instrum.Methods Phys.Res. B85, 499 (1994)

T.Osipowicz, S.C.Liew, K.K.Loh, I.Orlic, S.M.Tang, Th.Weber

Reconstruction of Ar Depth Profiles from PIXE Measurements

NUCLEAR REACTIONS Ar(α, X), E=1.5, 1.3 MeV; measured X-ray yields, Ar implantation on Al samples; deduced Ar depth profiles reconstruction.

doi: 10.1016/0168-583X(94)95871-8
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