NSR Query Results

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NSR database version of May 3, 2024.

Search: Author = N.Moncoffre

Found 3 matches.

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1992AR08      Nucl.Instrum.Methods Phys.Res. B66, 237 (1992)

H.Artigalas, A.Chevarier, N.Chevarier, M.El Bouanani, E.Gerlic, N.Moncoffre, B.Roux, M.Stern, J.Tousset

Nitrogen Profiling in Nitride Films and Nitrogen-Implanted Samples using the ¹⁴N(α, α) and ¹⁴N(α, p) Reactions at 6 MeV Incident Energy

NUCLEAR REACTIONS ¹⁴N(α, α), (α, p), E=5.2-7.5 MeV; measured σ(θ) vs E. Accurate nitrogen profile determination, TiN, NbTiN films, nitrogen implanted steel.

doi: 10.1016/0168-583X(92)96157-T
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetD0399.

1990EL05      Nucl.Instrum.Methods Phys.Res. B52, 182 (1990)

M.A.El Khakani, G.Marest, N.Moncoffre, J.Tousset

Depth Profiling of Nickel using the Nuclear Resonant ⁵⁸Ni(p, γ)⁵⁹Cu Reaction: Application to Ni-Fe mixed bilayers and Ni-implanted iron

NUCLEAR REACTIONS, ICPND ⁵⁸Ni(p, γ), E ≈ 1.415-1.445 MeV; measured γ(θ), Eγ, Iγ, γ yield. Depth profiling.

doi: 10.1016/0168-583X(90)90586-J
Citations: PlumX Metrics

1990MO21      Nucl.Instrum.Methods Phys.Res. B45, 81 (1990)

N.Moncoffre, N.Millard, H.Jaffrezic, J.Tousset

Boron Analysis of Thin Layers Using Prompt Nuclear Techniques

NUCLEAR REACTIONS ¹¹B(α, α), E < 7.5 MeV; measured σ(θ) vs E; deduced constant σ region.

doi: 10.1016/0168-583X(90)90789-W
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetF1195.