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NSR database version of May 8, 2024.

Search: Author = M.Ostling

Found 3 matches.

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1995HU23      Nucl.Instrum.Methods Phys.Res. B101, 263 (1995)

M.Hult, M.El Bouanani, L.Persson, H.J.Whitlow, M.Andersson, C.Zaring, M.Ostling, D.D.Cohen, N.Dytlewski, I.F.Bubb, P.N.Johnston, S.R.Walker

Empirical Characterisation of Mass Distribution Broadening in ToF-E Recoil Spectrometry

doi: 10.1016/0168-583X(95)00270-7
Citations: PlumX Metrics

1994HU16      Nucl.Instrum.Methods Phys.Res. B85, 916 (1994)

M.Hult, H.J.Whitlow, M.Ostling, N.Lundberg, C.Zaring, D.D.Cohen, N.Dytlewski, P.N.Johnston, S.R.Walker

RBS and Recoil Spectrometry Analysis of CoSi2 Formation on GaAs

NUCLEAR REACTIONS Ga, As(α, α), E=2.4 MeV; measured Rutherford backscattering spectra, reference, annealed samples. Rutherford back scattering, recoil spectrometry, CoSi2 formation on GaAs.

doi: 10.1016/0168-583X(94)95950-1
Citations: PlumX Metrics

1994JO11      Nucl.Instrum.Methods Phys.Res. B85, 907 (1994)

P.N.Johnston, S.R.Walker, I.F.Bubb, D.D.Cohen, N.Dytlewski, M.Hult, H.J.Whitlow, C.Zaring, M.Ostling, M.Andersson

Mass and Energy Dispersive Recoil Spectrometry of Si(x)Ge(1-x) Grown by Electron Beam Evaporation

NUCLEAR REACTIONS O, Si, Ge, C(127I, X), E=77 MeV; measured recoil energy spectra, X=O, Si, Ge, C respectively; deduced O contaminant, levels quantification. Mass, energy dispersive recoil spectrometry.

doi: 10.1016/0168-583X(94)95948-X
Citations: PlumX Metrics

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