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NSR database version of May 3, 2024.

Search: Author = M.Kiuchi

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1994MO35      Nucl.Instrum.Methods Phys.Res. B85, 741 (1994))

Y.Mokuno, Y.Horino, A.Kinomura, A.Chayahara, M.Kiuchi, K.Fujii, M.Takai

MeV Heavy Ion Microprobe PIXE for the Analysis of the Materials Surface

NUCLEAR REACTIONS ²⁷Al, Si(p, X), E=2 MeV; measured K X-ray maps; deduced surface sensitivity increases. Phosphorus microprobe also used.

ATOMIC PHYSICS ²⁷Al, Si(p, X), E=2 MeV; measured K X-ray maps; deduced surface sensitivity increases. Phosphorus microprobe also used.

doi: 10.1016/0168-583X(94)95914-5
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