NSR Query Results
Output year order : Descending NSR database version of May 6, 2024. Search: Author = Kawaldeep Found 7 matches. 2001SI01 Appl.Radiat.Isot. 54, 261 (2001) K.Singh, Kawaldeep, H.S.Sahota Study of Nuclear Quadrupole Interactions in Different Environments of 75Se by Sum Peak Method RADIOACTIVITY 75Se(EC); measured Eγ, Iγ, sum peak relative intensity; deduced nuclear quadrupole interaction frequencies, electric field gradients in various chemical environments.
doi: 10.1016/S0969-8043(00)00100-7
1996SI26 Appl.Radiat.Isot. 47, 697 (1996) K.Singh, R.Rani, V.Kumar, Kawaldeep Energy Absorption Coefficients for 662 keV γ-Rays in Some Compounds
doi: 10.1016/0969-8043(95)00286-3
1995KU32 Appl.Radiat.Isot. 46, 875 (1995) V.Kumar, Rama Rani, Kawaldeep, K.Singh Study of Some Nuclear Parameters in Decay of 131Ba RADIOACTIVITY 131Ba(EC); measured Eγ, Iγ. 131Cs level deduced K-capture probabilities, branching ratios, K-shell ICC.
doi: 10.1016/0969-8043(95)00174-C
1995KU34 J.Radioanal.Nucl.Chem. 189, 3 (1995) The Decay of 153Gd RADIOACTIVITY 153Gd(EC); measured Eγ, Iγ, I X-ray, E X-ray, relative absolute intensities; deduced K-capture probability, Q(EC). 153Eu levels deduced electron capture intensities. Sum peak method calculations.
doi: 10.1007/BF02040175
1994KU43 Appl.Radiat.Isot. 45, 875 (1994) K-Electron Capture Probability to 165 keV Level in the Decay of 139Ce RADIOACTIVITY 139Ce(EC); measured Iγ/I(K X-ray); calculated K-electron capture probability. 139Ce, 139La deduced mass difference.
doi: 10.1016/0969-8043(94)90218-6
1993KA30 J.Phys.Soc.Jpn. 62, 901 (1993) Kawaldeep, V.Kumar, K.S.Dhillon, K.Singh K-Capture Probabilities to the Excited States of 152Sm in the Decay of 152Eu RADIOACTIVITY 152Eu(β-), (β+), (EC); measured Eγ, Iγ, γ(K X-ray)-sum coincidence. 152Sm levels deduced K-capture probabilities.
1992SI23 Appl.Radiat.Isot. 43, 1521 (1992) K.Singh, Kawaldeep, V.Kumar, Neena, R.Kaur Beta-Particle and Gamma-Ray Emission Probabilities in the Decay of 160Tb RADIOACTIVITY 160Tb(β-); measured Eγ, relative Iγ. 160Dy levels deduced γ-emission probabilities. Semiconductor detectors.
doi: 10.1016/0883-2889(92)90184-G
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