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NSR database version of April 27, 2024.

Search: Author = H.Negm

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2015NE18      J.Nucl.Sci.Technol.(Tokyo) 52, 811 (2015)

H.Negm, H.Ohgaki, I.Daito, T.Hayakawa, H.Zen, T.Kii, K.Masuda, T.Hori, R.Hajima, T.Shizuma, N.Kikuzawa

Reaction-yield dependence of the (γ, γ') reaction of 238U on the target thickness

NUCLEAR REACTIONS 238U(γ, γ'), E=2.475 MeV; measured reaction products, Eγ, Iγ; deduced nuclear resonance fluorescence (NRF) yield as a function of the target thickness, σ.

doi: 10.1080/00223131.2014.980348
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetL0267.

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