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NSR database version of April 27, 2024.
Search: Author = E.H.Heijne
Found 3 matches.
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1998AN16
Phys.Lett. 433B, 209 (1998)
E.Andersen, F.Antinori, N.Armenise, H.Bakke, J.Ban, D.Barberis, H.Beker, W.Beusch, I.J.Bloodworth, J.Bohm, R.Caliandro, M.Campbell, E.Cantatore, N.Carrer, M.G.Catanesi, E.Chesi, M.Dameri, G.Darbo, A.Diaczek, D.Di Bari, S.Di Liberto, B.C.Earl, D.Elia, D.Evans, K.Fanebust, R.A.Fini, J.C.Fontaine, J.Ftacnik, B.Ghidini, G.Grella, M.Guida, E.H.M.Heijne, H.Helstrup, A.K.Holme, D.Huss, A.Jacholkowski, G.T.Jones, P.Jovanovic, A.Jusko, V.A.Kachanov, T.Kachelhoffer, J.B.Kinson, A.Kirk, W.Klempt, B.T.H.Knudsen, K.Knudson, I.Kralik, J.C.Lassalle, V.Lenti, R.Lietava, R.A.Loconsole, G.Lovhoiden, M.Luptak, V.Mack, V.Manzari, P.Martinengo, M.A.Mazzoni, F.Meddi, A.Michalon, M.E.Michalon-Mentzer, P.Middelkamp, M.Morando, M.T.Muciaccia, E.Nappi, F.Navach, P.I.Norman, B.Osculati, B.Pastircak, F.Pellegrini, K.Piska, F.Posa, E.Quercigh, R.A.Ricci, G.Romano, G.Rosa, L.Rossi, H.Rotscheidt, K.Safarik, S.Saladino, C.Salvo, L.Sandor, T.Scognetti, G.Segato, M.Sene, R.Sene, S.Simone, A.Singovsky, W.Snoeys, P.Staroba, S.Szafran, M.Thompson, T.F.Thorsteinsen, G.Tomasicchio, G.D.Torrieri, T.S.Tveter, J.Urban, G.Vassiliadis, M.Venables, O.Villalobos Baillie, T.Virgili, A.Volte, M.F.Votruba, P.Zavada
Enchancement of Central Λ, Ξ aand Ω Yields in Pb-Pb Collisions at 158 A GeV/c
NUCLEAR REACTIONS 1H, Pb(Pb, X), E at 158 GeV/c/nucleon; measured Ξ, Λ, Ω hyperon, antihyperon yields; deduced rapidity dependence.
doi: 10.1016/S0370-2693(98)00689-3
Citations: PlumX Metrics
1996HE36
Nucl.Instrum.Methods Phys.Res. A383, 55 (1996)
E.H.M.Heijne, and the CERN RD19 and WA97 Collaborations
LHC1: A semiconductor pixel detector readout chip with internal, tunable delay providing a binary pattern of selected events
doi: 10.1016/S0168-9002(96)00658-4
Citations: PlumX Metrics
1994HE39
Nucl.Instrum.Methods Phys.Res. A348, 399 (1994)
E.H.M.Heijne, and the CERN RD19 Collaboration
Development of Silicon Micropattern Pixel Detectors
RADIOACTIVITY 109Cd(EC); measured γ spectra; deduced detector noise level. Silicon micropattern pixel detectors.
doi: 10.1016/0168-9002(94)90768-4
Citations: PlumX Metrics
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