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NSR database version of May 8, 2024.

Search: Author = D.Endisch

Found 3 matches.

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1995EN09      Nucl.Instrum.Methods Phys.Res. B100, 125 (1995)

D.Endisch, H.J.Osten, P.Zaumseil, M.Zinke-Allmang

Backscattering Analysis of Si(1-y)C(y) Layers using the ¹²C(⁴He, ⁴He)¹²C Resonance at 4.265 MeV

NUCLEAR REACTIONS ¹²C(α, α), E=4.265 MeV; measured resonance backscattering spectra; deduced C analysis in MBE grown Si(1-y)C(y) layers.

doi: 10.1016/0168-583X(95)00259-6
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1994EN07      Nucl.Instrum.Methods Phys.Res. B84, 380 (1994)

D.Endisch, H.Sturm, F.Rauch

Nuclear Reaction Analysis of Hydrogen at Levels Below 10 at.ppm

NUCLEAR REACTIONS, ICPND ¹H(¹⁵N, α), E=8-11.6 MeV; measured γ yield. Bore-hole BGO scintillation counter, profiling.

doi: 10.1016/0168-583X(94)95731-2
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1992EN02      Nucl.Instrum.Methods Phys.Res. B62, 513 (1992)

D.Endisch, F.Rauch, A.Gotzelmann, G.Reiter, M.Stamm

Application of the ¹⁵N Nuclear Reaction Technique for Hydrogen Analysis in Polymer Thin Films

NUCLEAR REACTIONS ²H(¹⁵N, αγ), (¹⁵N, nγ), (¹⁵N, pγ), E=6.4 MeV; measured Eγ, Iγ. Hydrogen analysis in polymer thin films, depth resolution.

doi: 10.1016/0168-583X(92)95384-4
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