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NSR database version of May 3, 2024.

Search: Author = C.N.Chang

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1994CH66      J.Phys.(London) B27, 5251 (1994)

C.-N.Chang, C.-T.Chen, C.-C.Yen, Y.-H.Wu, C.-W.Su, S.-K.Chiou

The Vanadium K(β)/K(α) Intensity Ratios of Some Vanadium Compounds

NUCLEAR REACTIONS ^50,51V(X, X), E not given; measured K X-ray spectra; deduced I X-ray ratios. Si(Li) X-ray spectrometer, X-rays from Mo foil irradiation by ²⁴¹Am source.

ATOMIC PHYSICS ^50,51V(X, X), E not given; measured K X-ray spectra; deduced I X-ray ratios. Si(Li) X-ray spectrometer, X-rays from Mo foil irradiation by ²⁴¹Am source.

doi: 10.1088/0953-4075/27/21/017
Citations: PlumX Metrics

1973CH39      Nucl.Instrum.Methods 109, 327 (1973)

C.N.Chang, J.J.Kent, J.F.Morgan, S.L.Blatt

Total Cross Section Measurements by X-Ray Detection of Electron-Capture Residual Activity

NUCLEAR REACTIONS ⁴⁸Ti(α, n), E=5-11 MeV; measured σ(E).

doi: 10.1016/0029-554X(73)90282-6
Citations: PlumX Metrics
Data from this article have been entered in the EXFOR database. For more information, access X4 datasetC0951.