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Search: Author = A.Lombao

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1994DO26      Nucl.Instrum.Methods Phys.Res. B89, 174 (1994)

M.Dobeli, A.Lombao, D.Vetterli, M.Suter

Thin Layer Analysis with Heavy Ion RBS

NUCLEAR REACTIONS Co, Si, Ni, Ti(¹⁶O, ¹⁶O), E=10 MeV; measured Rutherford back scattering spectra; deduced suitability for thin layer analysis. Tof spectrometer, ¹³C, ²⁸Si, ³⁵Cl projetiles also included.

doi: 10.1016/0168-583X(94)95167-5
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