References quoted in the XUNDL dataset: 235U 235U IT:T1/2:XUNDL-9

1 reference found.

Clicking on a keynumber will list datasets that reference the given article.

Return to 235U IT:T1/2:XUNDL-9

2018SH23

Phys.Rev. C 98, 014306 (2018)

Y.Shigekawa, Y.Kasamatsu, Y.Yasuda, M.Kaneko, M.Watanabe, A.Shinohara

Variation of half-life and internal-conversion electron energy spectrum between ^235mU oxide and fluoride

RADIOACTIVITY ^235mU(IT)[from ²³⁹Pu α decay]; measured E(ce), I(ce), and T_1/2 of ^235mU by decay curves for internal conversion (IC) electrons using oxide and fluoride compounds of ^235mU and retarding-field electron analyzer; deduced shorter half-life for ^235mU fluoride as compared to that for ^235mU oxide, and clear difference in the IC electron energy spectra, analyzed through relativistic density functional theory (DFT) calculations of binding energies and molecular orbital states of both the compounds. Comparison with previous experimental results.

doi: 10.1103/PhysRevC.98.014306