Nucl.Phys. A616, 329c (1997)

W.Mittig, M.Chartier, J.C.Angelique, G.Audi, J.M.Casandjian, A.Cunsolo, C.Donzaud, M.Chabert, J.Ferme, L.K.Fifield, A.Foti, A.Gillibert, A.Lepine-Szily, M.Lewitowicz, S.Lukyanov, M.Mac Cormick, D.J.Morrissey, M.H.Moscatello, O.H.Odland, N.A.Orr, A.Ostrowski, G.Politi, C.Spitaels, B.M.Sherrill, C.Stephan, T.Suomijarvi, L.Tassan-Got, D.J.Vieira, A.C.C.Villari, J.M.Wouters

Mass Measurements Near N = Z

NUCLEAR REACTIONS Ni(⁷⁸Kr, X), E=73 MeV/nucleon; measured fragment tof; deduced secondary beams (with mass ≈ 60-80) production related features. ⁵⁸Ni(⁵⁰Cr, X), E=5.1 MeV/nucleon; measured fragment tof; deduced ¹⁰⁰Sn production σ. ¹⁰⁰Cd, ¹⁰⁰Sn, ¹⁰⁰In deduced masses relative to ¹⁰⁰Ag. Pure secondary beams from ions stripping technique, α-, SPEG spectrometers.

doi: 10.1016/S0375-9474(97)00104-8