Improved semi-empirical relationship for α-decay half-lives

Shan Zhang (张闪), Yanli Zhang (张彦立), Jianpo Cui (崔建坡), and Yanzhao Wang (王艳召)
Phys. Rev. C 95, 014311 – Published 11 January 2017

Abstract

An improved semi-empirical relationship for α-decay half-lives is proposed by introducing a precise radius formula and an analytic expression for preformation probability. By using the improved relationship, the α-decay half-lives of 421 nuclei are calculated. It is shown that the accuracy of this semi-empirical relationship is improved significantly compared to its predecessor. Further research shows that it also reproduces the experimental half-lives of the superheavy nuclei well. Last, with the improved formula the α-decay half-lives of the Z=118121 isotopes are predicted, which are helpful for future experiments. In addition, there is a prediction of a magic number effect at N=184.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 12 September 2016
  • Revised 27 October 2016

DOI:https://doi.org/10.1103/PhysRevC.95.014311

©2017 American Physical Society

Physics Subject Headings (PhySH)

Nuclear Physics

Authors & Affiliations

Shan Zhang (张闪)1,2,*, Yanli Zhang (张彦立)1,2, Jianpo Cui (崔建坡)1,2, and Yanzhao Wang (王艳召)1,2,3,†

  • 1Department of Mathematics and Physics, Shijiazhuang TieDao University, Shijiazhuang 050043, China
  • 2Institute of Applied Physics, Shijiazhuang TieDao University, Shijiazhuang 050043, China
  • 3China Institute of Atomic Energy, P.O. Box 275 (10), Beijing 102413, China

  • *zhangshan26@yeah.net
  • Corresponding author: yanzhaowang09@126.com

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 95, Iss. 1 — January 2017

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review C

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×