High precision half-life measurement of Sm147α decay from thin-film sources

H. Wilsenach, K. Zuber, D. Degering, R. Heller, and V. Neu
Phys. Rev. C 95, 034618 – Published 31 March 2017

Abstract

An investigation of the α decay of Sm147 was performed using an ultra-low-background twin Frisch-grid ionization chamber (TF-GIC). Four natural samarium samples were produced using pulsed laser deposition in ultrahigh vacuum. The abundance of the Sm147 isotope was measured using inductively coupled plasma mass spectrometry. A combined half-life value for Sm147 of 1.079(26)×1011 yr was measured. A search for the α decay into the first excited state of Nd143 has been performed using γ spectroscopy, resulting in a lower half-life limit of T1/2>3.1×1018 yr (at 90% C.L.).

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  • Received 9 November 2016
  • Revised 19 January 2017

DOI:https://doi.org/10.1103/PhysRevC.95.034618

©2017 American Physical Society

Physics Subject Headings (PhySH)

Nuclear Physics

Authors & Affiliations

H. Wilsenach* and K. Zuber

  • Institut für Kern- und Teilchenphysik, Technische Universität Dresden, 01069 Dresden, Germany

D. Degering

  • VKTA - Radiation Protection, Analytics and Disposal Rossendorf e.V., P.O. Box 510119, 01314 Dresden, Germany

R. Heller

  • Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstr. 400, 01328 Dresden, Germany

V. Neu

  • Institute for Metallic Materials and IFW Dresden, Helmholtzstrasse 20, 01069 Dresden, Germany

  • *Corresponding author: heinrich.wilsenach@tu-dresden.de

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Issue

Vol. 95, Iss. 3 — March 2017

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