Level widths and level densities in Si28, Ti46, Cr52, and Ni60 from Ericson fluctuations

Americo Salas-Bacci, Steven M. Grimes, Thomas N. Massey, Yannis Parpottas, Raymond T. Wheeler, and James E. Oldendick
Phys. Rev. C 70, 024311 – Published 26 August 2004

Abstract

Ericson fluctuations in the differential cross sections were investigated for the compound reactions Al27(p,n0)Si27, Sc45(p,n4)Ti45, Sc45(p,n5)Ti45, V51(p,n0)Cr51, and Co59(p,n0)Ni59. Level widths in the compound nuclei Si28, Ti46, Cr52, and Ni60 were extracted from the analysis of the differential cross sections by the Fourier method and a nonlinear fit to the lnAk2+Bk2 distribution. The neutron spectra for each reaction were measured at least at three backward angles but the coherence width Γ did not show a strong angular dependence. Nuclear level densities for the above nuclei were extracted by relating the average level spacing DJπ to the average level width ΓJπ using the fluctuation theory. Reasonable agreements were found with other level densities and level density compilations based in the Fermi gas formalism of Al-Quraishi and Huang for Si28, Ti46, and Cr52 but the comparison diverges for Ni60 for which additional measurements are required in order to clarify the observed discrepancies. The level density parameters that best describe the data are a=3.5 and δ=4.0, U<25MeV, for Si28, a=4.8 and δ=0.3, U<20MeV, for Ti46, and a=4.8 and δ=0.3, U<20MeV, for Cr52.

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  • Received 4 March 2004

DOI:https://doi.org/10.1103/PhysRevC.70.024311

©2004 American Physical Society

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Vol. 70, Iss. 2 — August 2004

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