Isotope shift in semiconductors with transition-metal impurities: Experiment and theory applied to ZnO:Cu

P. Dahan, V. Fleurov, P. Thurian, R. Heitz, A. Hoffmann, and I. Broser
Phys. Rev. B 57, 9690 – Published 15 April 1998
PDFExport Citation

Abstract

Isotope shifts for various lines associated with excitations of transition-metal impurities in semiconductors are considered. Special attention is paid to ZnO:Cu, for which experimental results are presented. Isotope shifts are measured for the so-called photoluminescence α and β zero-phonon lines associated with excitations of bound excitons, and of the zero-phonon line associated with the intracenter Cu2+(2T22E) transition. These shifts appear to be negative and nearly equal. A theoretical model explaining these results is proposed, which incorporates the mode softening mechanism and the covalent swelling of the impurity d electron wave functions. It is shown that, contrary to transitions in simple neutral impurities, this mechanism works both for the excited and ground states of all processes in transition-metal impurities considered here. Using reasonable values of the parameters of the system, we are able to explain both the sign and value of the isotope shifts.

  • Received 15 October 1996

DOI:https://doi.org/10.1103/PhysRevB.57.9690

©1998 American Physical Society

Authors & Affiliations

P. Dahan and V. Fleurov

  • Beverly and Raymond Sackler Faculty of Exact Sciences, School of Physics and Astronomy, Tel Aviv University, Tel Aviv 69978, Israel

P. Thurian, R. Heitz, A. Hoffmann, and I. Broser

  • Institute für Festkörperphysik der TU-Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany

References (Subscription Required)

Click to Expand
Issue

Vol. 57, Iss. 16 — 15 April 1998

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×