Measurement of the half-life of <span class="aps-inline-formula"><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><mrow><mmultiscripts><mrow><mi mathvariant="normal">Li</mi></mrow><mprescripts></mprescripts><mrow></mrow><mrow><mn>8</mn></mrow><mrow></mrow><mrow></mrow></mmultiscripts></mrow></math></span>

K. E. Sale; T-F. Wang; R. N. Boyd; G. J. Mathews; D. W. Heikkinen; M. L. Roberts; M. S. Islam; P. B. Corn

doi:10.1103/PhysRevC.41.2418

Measurement of the half-life of ${}^{8}{Li}$

K. E. Sale, T-F. Wang, R. N. Boyd, G. J. Mathews, D. W. Heikkinen, M. L. Roberts, M. S. Islam, and P. B. Corn

Phys. Rev. C 41, 2418 – Published 1 May 1990

Abstract

We present results of a measurement of the beta-decay half-life of ${}^{8}{Li}$ using an ${}^{8}{Li}$ radioactive ion beam implanted in a Si detector. The half-life is found to be 840.3±0.9 ms.

Received 14 December 1989

DOI:https://doi.org/10.1103/PhysRevC.41.2418

Authors & Affiliations

K. E. Sale, T-F. Wang, R. N. Boyd, G. J. Mathews, D. W. Heikkinen, and M. L. Roberts

Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94550

M. S. Islam and P. B. Corn

Department of Physics, The Ohio State University, 174 W. 18th Avenue, Columbus, Ohio 43210

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Vol. 41, Iss. 5 — May 1990

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Physical Review C

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