Off-resonance and straggling measurements using the 1H(15N, αγ)12C reaction
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Cited by (12)
Hydrogen in Metals
2014, Physical Metallurgy: Fifth EditionHydrogen detection near surfaces and shallow interfaces with resonant nuclear reaction analysis
2014, Surface Science ReportsCitation Excerpt :The non-resonant γ-yield Yoff is proportional to the total H content in the surface layer, i.e., to the integrated γ-yield measured with the first resonance at 6.385 MeV, Ion(I), and to the off-resonant cross section, σoff: Yoff=σoff×Ion(I). When σoff is known and the first-resonance γ-yield of surface-H (Ion(I)) has been determined from a shallow depth profile near 6.385 MeV, the non-resonant reaction yield can be estimated and, if necessary, subtracted from the raw γ-yield at high 15N energy to determine the H concentration at larger depths correctly [100,110,111]. Evaluations of the energy-dependent off-resonant 1H(15N,αγ)12C reaction cross section σoff(E) between 6.4 and 13.4 MeV are available for the γ-detector positioned on [98–100,111] and 90° off the ion beam axis [110].
Evaluation of non-resonant background in hydrogen depth profiling via <sup>1</sup>H(<sup>15</sup>N,αγ)<sup>12</sup>C nuclear reaction analysis near 13.35 MeV
2005, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsNuclear data sheets for A = 161
2000, Nuclear Data SheetsSynthesis of yttriumtrihydride films for ex-situ measurements
1996, Journal of Alloys and CompoundsNuclear reaction analysis of hydrogen at levels below 10 at.ppm
1994, Nuclear Inst. and Methods in Physics Research, B