High Precision Studies on the Level Scheme of Se80 by the Resonant-Scattering Method

H. Szichman
Phys. Rev. C 8, 1429 – Published 1 October 1973
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Abstract

The energies and reduced strengths of the γ rays following deexcitation of the 7818.9-keV highly excited level in Se80 reached by the (γ,γ) reaction, were measured using a nickel capture γ source. The level scheme deduced for this nucleus is presented. Measurements of the angular distributions of the scattered radiation permitted the assignment of spin values for most of the low-lying levels in this nucleus. Parity determinations were made comparing the reduced strengths with the statistics of known E 1 and M 1 transitions.

  • Received 5 March 1973

DOI:https://doi.org/10.1103/PhysRevC.8.1429

©1973 American Physical Society

Authors & Affiliations

H. Szichman

  • Nuclear Physics Department, Soreq Nuclear Research Center, Yavne, Israel

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Vol. 8, Iss. 4 — October 1973

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