References quoted in the XUNDL dataset: 26SI 1H(27AL,2N):T1/2:XUNDL-8

2 references found.

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2008MA39

Eur.Phys.J. A 37, 151 (2008); Erratum Eur.Phys.J. A 38, 247 (2008)

I.Matea, J.Souin, J.Aysto, B.Blank, P.Delahaye, V.-V.Elomaa, T.Eronen, J.Giovinazzo, U.Hager, J.Hakala, J.Huikari, A.Jokinen, A.Kankainen, I.D.Moore, J.-L.Pedroza, S.Rahaman, J.Rissanen, J.Ronkainen, A.Saastamoinen, T.Sonoda, C.Weber

Precise half-life measurement of the ²⁶Si ground state

RADIOACTIVITY ²⁶Si(β⁺); measured Eγ, Iγ, Eβ, Iβ, βγ-coin, T_1/2, β-branching ratio using the IGISOL technique with the JYFLTRAP facility. Comparison with other results.

doi: 10.1140/epja/i2008-10623-5

2010IA01

Phys.Rev. C 82, 035502 (2010)

V.E.Iacob, J.C.Hardy, A.Banu, L.Chen, V.V.Golovko, J.Goodwin, V.Horvat, N.Nica, H.I.Park, L.Trache, R.E.Tribble

Precise half-life measurement of the superallowed β⁺ emitter ²⁶Si

RADIOACTIVITY ²⁶Si(β⁺)[from ¹H(²⁷Al, 2n), E=30 MeV/nucleon]; measured Eβ, Iβ using a 4π proportional gas counter system, and half-life. Comparison with previous results.

doi: 10.1103/PhysRevC.82.035502