References quoted in the XUNDL dataset: 26AL 26SI EC DECAY:2.23 S:XUNDL-4

1 reference found.

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2008MA39

Eur.Phys.J. A 37, 151 (2008); Erratum Eur.Phys.J. A 38, 247 (2008)

I.Matea, J.Souin, J.Aysto, B.Blank, P.Delahaye, V.-V.Elomaa, T.Eronen, J.Giovinazzo, U.Hager, J.Hakala, J.Huikari, A.Jokinen, A.Kankainen, I.D.Moore, J.-L.Pedroza, S.Rahaman, J.Rissanen, J.Ronkainen, A.Saastamoinen, T.Sonoda, C.Weber

Precise half-life measurement of the ²⁶Si ground state

RADIOACTIVITY ²⁶Si(β⁺); measured Eγ, Iγ, Eβ, Iβ, βγ-coin, T_1/2, β-branching ratio using the IGISOL technique with the JYFLTRAP facility. Comparison with other results.

doi: 10.1140/epja/i2008-10623-5

Note: Additional references listed in dataset: 2008AU03,. See dataset contents for details.