Dataset referencing 2012FA07
Appl.Radiat.Isot. 70, 2328 (2012)
K.Fang, D.Wang, S.Yang, J.Zhao, H.Peng, Q.Wang, T.Wang
Half life of 175Hf
RADIOACTIVITY 175Hf(EC) [from Hf(n, X)175Hf, E=14 MeV]; measured decay products, Eγ, Iγ; deduced T1/2. Comparison with available data.
doi: 10.1016/j.apradiso.2012.06.010